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The Nanonics Hydra - The Next Evolution in BioAFM
Nanonics Hydra Specifications

 

Available Modes of Operation 

AFM

 

AC Mode
Contact Mode (Optional)
All AFM Modes of Operation with probe or sample scanning.

Near-field
Optical Imaging & Illumination

Transmission, Reflection, Collection, Illumination

Differential Interference Contrast

Reflection and Transmission

Refractive-Index Profiling

Reflection and Transmission

Thermal Conductivity and Spreading Resistance Profiling

Contact or AC mode
No Feedback Laser Induced Extraneous Carriers in Semiconductors with tuning fork feedback option 

On-line Far-field Confocal with
Raman and Fluorescence
Spectral Imaging

Reflection and Transmission
Tip Enhanced Raman Scattering for Selective Raman Scattering of
Ultrathin Layers such as Strained Silicon

NanoLithography

NanoFountainPen delivery of chemicals and gases; Near-field photolithography; and other conventional means of nanolithography such as electrical oxidation etc; with on-line analysis with an additional probe

NanoIndentation

Application of MegaPascals of force, allowing exact positioning and controlled application of force with on-line analysis with an additional probe.

  All the above modes of operation are provided fully integrated with on-line AFM imaging.

SPM Scan Head Specifications

Sample Scanner    

Piezoelectric Based Flat Scanner (3D Flat Scanner™)
Height 7mm

Probe Scanner

 

Up to 4 independently controlled piezoelectric Flat Scanners (3D Flat Scanner™) modules
Height 7mm

SPM Scan Range

 

30 microns (XYZ) for each probe scanning module
100 microns (XYZ) sample scanning only
130 microns (XYZ) with sample and probe scanning
160 microns (XY) with sample and two probe scanning

Scanner Resoluton

 

Z < 0.005 nm 

XY < 0.015 nm (typical)
XY < 0.002 nm (low voltage mode)

Rough Positioning

 

Sample rough positioning:
XY motorized stage – range 5mm – resolution 0.25 micron
XY piezo-based movement via inertial motion
Tip rough positioning:
XY motorized stage – range 5mm – resolution 0.25 micron
Z motorized stage – range 10mm – resolution 0.065 micron

Feedback Mechanism

Ultra sensitive tuning fork feedback with high Q-Factor

Sample Geometries

 

 

 

Sample size:   Up to 16 mm standard
                       Up to 34 mm for upright microscope operation
                       Up to 55 mm without sample scanning

Custom sample sizes up to 200 mm also available

Liquid cell sample:
-        Standard petri dish
-        Modified liquid cells with different cover slips size

Unconventional Geometries: Hanging samples for edge profiling and other unconventional geometries possible.

Probes

All forms of cantilivered glass probes from Nanonics' exclusive NanoTool KitTM, NanoSensors including Akiyama tuning forks probes and Si probes.

Imaging Resolution

Far-field

Diffraction Limited

Optical

Optics providing 500 nm diffraction limited non-confocal operation

Confocal

200 nm

NSOM

100 nm on installation; 50 nm probes available

Topographic

Z noise 0.05 nm rms.
X.Y lateral resolution: convolution of tip diameter & sample

Thermal

From 100 nm

Resistance From 25 nm

Thermal & Resistance Imaging

Temperature

300 o C or greater, depending on sample to be investigated

Thermal

 

Unique exposed tip dual platinum nanowire probes fully insulated with glass coating:
Thermal Sensitivity 0.01 ºC
Measured Resistance Change per degree; 0.38 Ω/ºC

Resistance

 

 

Unique exposed tip platinum nanowire probes fully insulated with glass coating and
allowing for coax geometry structures:
Ultra high electro potential resolution.
Few tens of ohms contact resistance for probes <100nm.
Electrically stable & free from oxidation.

Electronics & Software

Control System

Integra Controller

Specifications
Supports various imaging modes including AFM (contact and non-contact), phase, error signal and NSOM
Up to 8 data channels can be read and imaged simultaneously.
All ADCs are 16 bit and DACs have16-bit resolution.
Image size continuously variable from 2x2 to 1024x1024
Inbuilt lock-in amplifier

There are two alternative software packages available:

Quartz Software Package Specifications:
User friendly 32-bit Windows application available for Windows 95/98, NT and XP
Intuitive scan parameter setup
Image and line profiles displayed in real time
2-D and 3-D image rendering
Extensive image processing options
Comprehensive image analysis features including: cross section, particle analysis, fractal analysis and z-data histogram
Import data as Windows bitmaps and ACSII. Export data as TIFF and Windows bitmaps and ACSII.

LabView Software Package Specifications:
User Friendly LabVIEW SPM based software for PCI-7344 with the following specifications:
AUX  Data acquisition
Image and line profiles displayed in real time
Intuitive scan parameter setup
Open Design enabling customization by user and interfacing with other LabVIEW modules

Nanonics Controller and software package based on Windows XP and Windows
XP LabView based software package. Real time image display, image acquisition up to 8 channels. Full access to all signals and readily integrated with external signals from other sources. Analysis software including all standard image processing routines and 3D rendering including collages of multiple signals.
Software modules available for spectral acquisition and analysis including Raman and fluorescence spectra, nanoindentation, nanolithography including
NanoChemwrite™ Fountain Pen NanoChemistry™ software suite.

Data Acquisition

From 2x2 to 1024x1024 and multiple Z acquisition

Analog Lock-in

Provides quadrature output. Information is readily available on R/? and I/Q in
output bandwidths of 15kHz (depending on DT card in use; the controller can
give up to 100 kHz).

Frequency Synthesizer

Direct Digital Synthesizer (DDS) system for frequency and phase adjustment with
32-bit frequency determination and 20-bit phase determination. This system uses
three independent generators. Two of these generators provide quadrature for
lock-in processing and the third generator is used for exciting with an autophase
algorithm. The system uses a clock frequency of 20 MHz with a stability of
5 ppm and provides frequency resolution of <5 mHz.

Amplitude

0 to 5 V p-p and maximum resolution of up to 0.2 mV
Amplitude, Phase and Frequency of the oscillator can be controlled with 100 kHz updates.

X, Y, and Z High Voltage Outputs

-145V to +145V

On-line Optical and Electron/ Ion Optical Integration

Type

Far-field, Confocal Optics, Near Field, micro-Raman; Scanning Electron Microscope (SEM) or Focused Ion Beam (FIB)

Integration

 

 

 

 

 

 

 

 

 

 

 

 

 

Free optical axis from above and below the sample for on-line optical or electron/ion optical characterization.

Integration with all forms of optical microscopes including upright microscopes
and upright microscope probe stations.

Integration with all standard microRaman 180 degree backscattering geometry
configurations, inverted microscopes and state of the art dual (4Pi) microscopes
such as Nanonics unique dual microscope.

All conventional far-field optical modes of operation are available, including
phase imaging and differential interference contrast.

NSOM with any optical microscope including upright, inverted and dual.

The completely free optical axis from above and below in all Nanonics MultiView Systems also allows for integration with (4Pi) dual microscopes for non-linear optical techniques including second harmonic and sum frequency generation microscopes, third harmonic imaging, coherent anti-Stokes Raman microscopes and stimulated emission depletion microscopy.

All Nanonics Systems and all Nanonics Multiple Probe Systems are unique
scanned probe microscopes with a completely free axis above the sample and
thus can be integrated transparently into scanning electron microscopes including field emission SEMs or focused ion beam systems.

Minimum Working Distance (WD) with High Numerical
Aperture (NA) Optical
Microscope Lenses

Upright Microscope or SEM or FIB:
   Optical Objective: 100 x 0.75NA
   Objective WD: 4.8mm

Inverted Microscope:
   All available objectives including oil immersion optical objectives

Detectors

Photomultiplier Tube, Avalanche Photo Diode or InGaAs Detectors

Lasers

Variety of lasers can be used from deep UV to near-IR

Video system

On Line CCD video imaging



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