Nanonics produces cantilevered AFM probes using glass pulling technology. This technology allows the varying of tip dimensions, angle of bending, aspect ratio, and cantilever length in a wide range. The probes are made of fused silica that is almost transparent. 
Click here for more information on probes and how to order
Nanonics produces cantilevered AFM probes using glass pulling technology. This technology allows the varying of tip dimensions, angle of bending, aspect ratio, and cantilever length in a wide range. The probes are made of fused silica that is almost transparent.
Key Features
Exposed Tip |
Provides complete optical access from above and below for full integration with optical microscopes, Raman spectrometers, FTIR spectrometer and other optical modalities.   |
OPTICAL AND SPECTRAL TRANSPARENCY |
AFM Probe is made from fused silica which do not have optical and Raman signature and thus prevent any the optical interference in combined AFM/Raman, AFM/Confocal measurements |
HIGH ASPECT RATIO |
The high aspect ratio probes with small opening angle enables scanning of deep trench structures and side walls.   |
MULTIPROBE CAPABILITIES |
Cantilevered shape and exposed tip enable to bring the tips of two probes in AFM feedback within nanometric distance one to another.  |
Specifications:
Supersharp:<10 nm
**Straight probes are available
DEEP TRENCH IMAGING
Trench profiling is a must for FIB etching for monitoring quality of the etching. Standard AFM systems fail in profiling deep trenches due to limitations of Z range and tip aspect ratio. Nanonics SPM systems provide large Z range of up to 170 microns and cantilevered glass probes with high aspect ratio.
Side Wall Imaging
Cantilevered and straight nanopipette probes can be filled with fluorescent materials. These active light sources can be provided with a variety of sensing capabilities. Sensors are currently available for H+, Na+, K+, Ca2+ and Cl-, other sensors are also available upon request.
Customizing
Wide range of the angles of bending, cantilever length, bending length, aspect ratio and coatings to meet needs of your sample geometry are available.
AFM Probes with Different Angles of Bending
Deprecated: Methods with the same name as their class will not be constructors in a future version of PHP; Tableigallery has a deprecated constructor in /home/nanonics/public_html/administrator/components/com_igallery/tables/igallery.php on line 6
Warning: count(): Parameter must be an array or an object that implements Countable in /home/nanonics/public_html/components/com_igallery/views/category/tmpl/default_main.php on line 18
AFM High Aspect Ratio and Length of Bending Probes
Warning: count(): Parameter must be an array or an object that implements Countable in /home/nanonics/public_html/components/com_igallery/views/category/tmpl/default_main.php on line 18
AFM Probes with Curvature Tip for Soft Materials and Nanoindentation
Warning: count(): Parameter must be an array or an object that implements Countable in /home/nanonics/public_html/components/com_igallery/views/category/tmpl/default_main.php on line 18
