The power of independently controlled multiprobe AFM with all SPM modes is exclusively and only available today in the Multiview 4000. As many as four probes operate simultaneously and independently, with each probe having its own feedback and scanning capabilities. Measure sophisticated properties only possible with the availability of multiple probes such as electrical, thermal and optical properties of devices. The MultiView4000 is a novel and only platform containing multiple probes/AFMs for advanced experiments such as: nanoscale transport, optical pump-probe, and read-write experiments. The MultiView4000 continues the tradition of the MultiView series, providing total optical flexibility and customization possibilities. Now, AFM Raman and Tip Enhanced Raman Spectroscopy (TERS) can be integrated with multiprobe capability. In addition, free optical access from above allows easy visualization of all probes and facilitates nanomanipulation.
Key Features
Simultaneously Characterize Multiple Dimensions
The simultaneous and independent SPM probe operation of up to 4 probes enables full characterization of all dimensions of samples and devices. All forms of SPM are enabled for each individual probe accompanied by total optical integration resulting in access to all modes including AFM, KPM, EFM, ANSOM, NSOM, STM, AFM-Raman, and TERS. Because these probes are designed for multiple probe operation, they can be brought to a nanometric separation distance thus ensuring that the same area is scanned with all the probes.
Nanoscale Transport
One probe can be the source of excitation while the second probe follows the transport process with high spatial resolution. Alternatively, optical pump/probe experiments can now be performed using one probe to optically pump while the other probe measures the optical output in a variety of configurations. An example of each type of measurement is shown below.
1. Thermal transport measurement within an SRAM device where heat is introduced at specific locations and detected at other locations. As contact is made in different regions of the SRAM with the thermal conductivity probe, the probe tip cools to different levels depending on the material's thermal conductivity. The resulting image is obtained by determining the current alterations that had to to be affected in order to keep the current flowing past the point resistance at a constant value.
2. With two cantilever, near-field optical probes with exposed tips, light is injected through one probe and is guided through the sample which is a fiber. With the second probe in place, this injected light can be collected and analyzed both spatially and temporally. In this image two NSOM probes are seen in AFM contact with the input and output of the fiber waveguide.
Nanoscale Manipulation and Measurement
One probe can be used for moving, cutting, or positioning a sample, while the other probe can be used to image the sample. For example, shown below is a chromosome that has been dissected with one probe (see image on left), while the other probes images the result of the nanomanipulation.
Spatially Friendly Glass Probes
While typical probes do not permit close proximity of probe tips, Nanonics has developed spatially and optically friendly glass based probes that allow for a close approach of the probe tips to within nm, as well as independent scanning of each probe. Nanonics' glass based probes offer excellent imaging in AFM modes, unparalleled aspect ratios, and support deep trench imaging as well as side wall imaging. They also permit singular electrical imaging and thermal imaging with glass encased nanowires.
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Left: Nanonics' patented bent cantilevered glass probe
Center: Online dual probes in contact with AFM feedback (side view)
Right: Online four probes in contact with AFM feedback (top view 500x magnifications)
Free Optical Axis from Above the Probe
The MultiView 4000 offers a completely free optical axis from above the probe, below the sample and 270 degrees around the probe. The Multiview 4000 boasts a 4.5mm working distance from above the probe for ultrahigh resolution optical or electron/optical viewing probes on opaque samples.
Probe Station for Electrical Measurements
Multiprobe capability is especially useful for electrical measurements since multiple probes can now be placed over the element to provide bias or probe its conductivity, resistance, etc just like in a probe station. Two-, three-, or four-point resistance measurements are possible. Multiple probes also enable flexible positioning and manipulation to provide bias, localized I-V measurements, and multichannel imaging.
Integrate SPM Modes with Topography
With a multiprobe system, resolution and tip quality no longer need to be compromised since each probe is now individualized for each measurement. In classic NSOM setups the NSOM probe would have the dual function of imaging topography and fluorescence where the topography image is compromised by the aperture (wider diameter) needed by the NSOM probe. But in a multiprobe setup, a standard SPM probe can be used the topography without affecting the NSOM fluorescence measurement.
The left and center images are the topography and fluorescence images, respectively, of lumogen dye particles collected in a multiprobe setup with different probes for topography and NSOM. The image on the right is the topography image of the same sample but collected with the NSOM probe, revealing the clear loss of resolution and morphology. The width of each image is 8um.
Modular Design for Easy Upgrade
The unique, modular design of the MultiView 4000 allows for the upgrade from one probe to two, three or four probes.
Start with 1 probe
Upgrade to 2 probes
Upgrade to 4 probes
Unique 3D Flatscan Scanner Technology
The design of the 3D Flatscan is a novel planar, folded-piezo flexure scan design that keeps the probes separated. The large vertical (axial) displacement of up to 100 microns allows for the use of multiple probes as well as the tracking of structures with very large topographical features. The minimal scanner height of 7mm allows for easy access with high powered microscope objectives from either above or below the scanning stages.
Ultra-sensitive Tuning Fork Feedback
Easy to use and ultimate force sensitivity with tuning fork feedback allowing soft approach of probes to one another for ultra-close positioning.
For a further explanation of this feedback mechanism, see our Tuning Fork Tutorial.
Tip & Sample Scanning Options
The MultiView 4000 provides both tip and sample scanning so that the user can select which mode of operation best suits their experimental needs. For example, a sample scanning stage enables easy and rapid alignment of the sample relative to the illumination source and ensures that the microscope optics are independent of the AFM scanner. On the other hand, the tip scanning stage means that the tip can be scanned while the illumination point is held constant.
NSOM Integrations
Click on any feature to learn more
Dual Configuration for Optical Pump/Probe
Optical pump/probe experiments can now be performed using one probe to optically pump while the other probe measures the optical output in a variety of configurations.
Two cantilever, near-field optical probes with exposed tips, light is injected through one probe and is guided through the sample which is a fiber. With the second probe in place, this injected light can be collected and analyzed both spatially and temporally. In this image, two NSOM probes are seen in AFM contact with the input and output of the fiber waveguide.
Cantilever probes for superior NSOM performance
Nanonics is the global pioneer in glass probe manufacturing and has developed a whole suite of probes for all your NSOM applications in our Nanotoolkit that are compatible with the MultiView 2000 system, featuring:
-Glass cantilevered normal force probes. These types of probes operate as standard robust AFM probes for easy, high-quality imaging of all samples. Additionally, the geometry of these probes provides unobstructed optical view from above and below
-Fiber probes with metallic nanoparticles in tip
-Metallized probes
-Straight probes also available for shear force feedback measurements
See here for more information on all probes
Completely flexible optical access - designed for NSOM use
This enables total flexibility in your NSOM setup, as the MultiView 4000 can be integrated with any optical microscope. Additionally, total optical access to sample and probe position from above is possible since the cantilever probe/scanner assembly does not obscure access
All Modes of NSOM
True Collection Mode
Collection mode NSOM is depicted in the schematic below, where the light illuminates the sample, and then is collected through the NSOM probe by a detector. The MultiView 4000 offers both tip scanning and a sample scanning stage with upto four probes that can scan independently and simultaneously. A sample scanning stage enables easy and rapid alignment of the sample relative to the illumination source and ensures that the microscope optics are independent of the AFM scanner. This instrumentation design is ideal for true collection mode NSOM.
True Reflection Mode
In true reflection mode, light is introduced via the NSOM probe, and then collected by a detector above the probe as shown in the schematic below. True Reflection mode NSOM is possible on the MultiView 4000 due to the use of transparent, cantilever probes. Furthermore, the design of the MultiView series separates the excitation and collection paths so that they don't affect each other, thus enabling true reflection mode NSOM measurements to be conducted. Other designs that take advantage of straight probes or apertured Si probes are significantly more challenging for true reflection mode.
Learn more about all of the modes of NSOM.
Raman Integrations
- Integrate with a standard commercial Raman microprobe optical microscope with no intervening optical fibers
- Background free Raman measurements
- Laser-free tuning fork feedback method replaces laser-based feedback
- Optically transparent cantilever glass probes
- Perform tip enhanced Raman spectroscopy (TERS)
- Cantilever nanopipette glass probes having single gold nanoparticles grown in tip
- Full integration with upright, inverted or dual (4Pi) optical microscopes
- Full integration with non-linear and multi-photon microscopes (e.g. second harmonic generation microscopes)
- Completely free optical axis from above and below the sample
- Complete freedom of optical microscopy nose piece rotation from above or below
- Open system architecture providing transmission, reflection, and collection modes
Click on any feature to learn more
Tuning fork feedback without laser interference
The MultiView 4000 is equipped with a laser-free feedback method called normal force tuning fork feedback. For example, many SPM laser-based feedback systems employ red lasers, which would then interfere with the Raman emission in the redo from the sample. The MultiView 4000 gets eliminates all problems associated with optical interference in your Raman experiments.
Effortless AFM and Raman integration
The MV 4000 can be combined with either an upright, inverted, or a dual microscope (combined upright and inverted) where the same SPM head is used for either microscope configurations. No modification of the Raman path is necessary to accomodate the SPM tip and head. This design results in a natural and straightforward Raman path for integration without the need for tilting or bending the Raman path to accomodate the SPM. Furthermore, transparent optical AFM probes provide a completely transparent optical system. Both reflection Raman and transmission Raman are standard on the MV 4000. Side illumination is also available. This sytem is compatible with 100x, NA 0.8 optical objective from the top and high numerical aperture oil immersion objectives from the bottom.
Built for TERS Operation
Quick and easy TERS hotspot
Detection: Combined tip and sample scanning stage within the same scanning system provides accurate positioning of the probe at the ideal location for TERS with respect to the focused laser spot.
Tip can be positioned within the center of the Raman hotspot for optimal TERS signal detection
Sample can be imaged with the sample scanning piezo stage without losing the TERS hotspot position.
All modes of TERS including STM and AFM-TERS with easy interchangeability are available. Thus the same probe (either conducting or with a conductive coating for STM-based feedback) can operate in AFM feedback using tuning fork based feedback for TERS measurements, and then it can be switched to tunneling based feedback for TERS operation in gap mode.
TERS on non-conducting surfaces
Availability of the upper XYZ piezo scanner for the tip scanning enables 3 point TERS measurements for comparing the difference between enhanced and non-enhanced spectra and extracting new information.
Best TERS Probes
A variety of probes including: transparent TERS probes with gold ball embedded inside the glass, STM and non-STM TERS probes, and gold and silver-coated AFM probes Nanonics TERS probes are supplied bent in the range of 45-60 degrees, the optimal angle for TERS excitation
Autofocus for Superior Raman
The MV 4000 provides autofocusing onto the sample at every pixel point. Thus for rough samples, tilted samples, or samples with unusual Z variation, the MultiView 4000 provides the best Raman resolution as it makes sure to have the sample in focus at every point a Raman spectrum is collected.
Raman in Fluids
Raman imaging in fluids is done with the water immersion objective. The advantages of the water immersion objectives are described in the tutorial . In addition, Raman can be combined with other functionalities such as scanning electrochemical microscopy (SECM). A description of combined Raman-SECM with an application of in situ monitoring Cu etching can be viewed here or downloaded by clicking here.
Multiple configurations
MV4000 - Horiba ExploRA Raman
MV 4000 - Raman Integration
Transparent Raman Integration of Multiprobe Cryogenic System with Renishaw MicroRaman
Transparent Raman Integration of Multiprobe Cryogenic System even with Nanonics or Commercial MicroRamans
Raman Integration
MultiView 4000TM/Renishaw Invia Raman Integration Package
MultiView 4000TM/HORIBA Xplora Raman Integration Packag
SEM/FIB Integrations
Environmental Chamber
- Multiprobe operation inside environmental chamber
- Free optical axis from top and bottom - complete optical integration with dual optical microscope
- Vacuum control
- Gas inlets/outlets
- T control - heating and cooling
Contact a Nanonics Specialist to Discuss Your Specific Needs
We are happy to answer all questions and inquiries
Images
MultiView 4000 four SPM probes platform
MultiView 4000 Tip and Sample scanning stages
Optical image of online four SPM probes in feedback.
Videos
MV4000 Integrated with Chamber
High Resolution Nanolithography with MultiProbe
Prof. Nancy Haegel: "Integrating Near-Field and Electron Optics..."
Watch 4 Probes Operate Simultaneously
Four Independently Controlled Probes
The Hydra Bio AFM system
Environmental Control Chambers for Scanned Probe Microscopy
