Next Generation Flat Panel Display Inspection
Nano-Optical Characterization of Electro-Luminescent Screens
OLED, QLED, and MicroLED screens are quickly becoming the new standard in the display market. Identifying nano-scale defects with full spectral and structural correlation is emerging as a critical need for these next generation screens. Nanonics NSOM systems can characterize sub-pixels on the nano-scale, enabling the analysis and correlation of key properties.
With just 1 NSOM scan, obtain a variety of measurements:
Topographical
Morphology - for accurate thickness measurement on the nanoscale.
Investigate film coating uniformity and sub pixel topographic profile.
Sub-diffraction optical imaging with structural correlation.
Light Emission
Sub-diffractive resolution for assessing sub pixel uniformity.
Edge blurring and spill over identification.
Luminescence from 350-900 nm.
Spectral
Examine sub-pixel color, quality, and stability inconsistencies.
Accurate color identification.
Thermal
Nano-scale temperature measurements.
Fully compatible, and ready to be integrated, with existing tools:
AOI (Automated optical inspection)
SEM
Bright and dark optical microscopy
Profilometry
Spectrometers
For more information about industrial Flat Panel Display Inspection applications, please see our sister-site:
